Bumili SN74LVTH182502APM sa BYCHPS
Bumili na may garantiya
SN74LVTH182502APM
- Numero ng Bahagi:
- SN74LVTH182502APM
- Manufacturer:
- Paglalarawan:
- IC SCAN-TEST-DEV/XCVR 64-LQFP
- Lead Free Status / Katayuan ng RoHS:
- Lead libreng / RoHS compliant
- Magagamit na Dami:
- 13720 Pieces
- Data sheet:
- SN74LVTH182502APM.pdf
pagpapakilala
BYCHIPS ay ang stocking distributor para sa SN74LVTH182502APM, mayroon kaming mga stock para sa agarang pagpapadala at magagamit din para sa mahabang panahon supply. Mangyaring ipadala sa amin ang iyong plano sa pagbili para sa SN74LVTH182502APM sa pamamagitan ng email, bibigyan ka namin ng pinakamahusay na presyo ayon sa iyong plano.
Mga pagtutukoy
| Supply Boltahe: | 2.7 V ~ 3.6 V |
|---|---|
| Supplier aparato Package: | 64-LQFP (10x10) |
| serye: | 74LVTH |
| packaging: | Tray |
| Package / Kaso: | 64-LQFP |
| Ibang pangalan: | 296-8696 74LVTH182502APMG4 74LVTH182502APMG4-ND |
| operating Temperature: | -40°C ~ 85°C |
| Bilang ng mga Bits: | 18 |
| Salalayan Type: | Surface Mount |
| Moisture Sensitivity Level (MSL): | 3 (168 Hours) |
| Tagagawa Standard Lead Time: | 6 Weeks |
| Manufacturer Bilang Bahagi: | SN74LVTH182502APM |
| logic Type: | ABT Scan Test Device With Universal Bus Transceivers |
| Ang pinalawak Paglalarawan: | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
| paglalarawan: | IC SCAN-TEST-DEV/XCVR 64-LQFP |
| Email: | [email protected] |
Mga Kaugnay na bahagi para sa SN74LVTH182502APM
| larawan | Numero ng Bahagi | Mga Tagagawa | Paglalarawan | Tingnan |
|---|---|---|---|---|
|
SN74LVTH182502APMR | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Pagtatanong |
|
SN74LVTH18514DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Pagtatanong |
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Pagtatanong |
|
SN74LVTH182504APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Pagtatanong |
|
SN74LVTH182512DGGR | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | Pagtatanong |
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Pagtatanong |
|
SN74LVTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Pagtatanong |
|
SN74LVTH18504APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Pagtatanong |
|
SN74LVTH18502APMR | Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | Pagtatanong |
|
SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | Pagtatanong |
|
SN74LVTH18504APMR | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Pagtatanong |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog