Bumili SN74BCT8373ADW sa BYCHPS
Bumili na may garantiya
SN74BCT8373ADW
- Numero ng Bahagi:
- SN74BCT8373ADW
- Manufacturer:
- Paglalarawan:
- IC SCAN TEST DEVICE LATCH 24SOIC
- Lead Free Status / Katayuan ng RoHS:
- Lead libreng / RoHS compliant
- Magagamit na Dami:
- 18453 Pieces
- Data sheet:
- SN74BCT8373ADW.pdf
pagpapakilala
BYCHIPS ay ang stocking distributor para sa SN74BCT8373ADW, mayroon kaming mga stock para sa agarang pagpapadala at magagamit din para sa mahabang panahon supply. Mangyaring ipadala sa amin ang iyong plano sa pagbili para sa SN74BCT8373ADW sa pamamagitan ng email, bibigyan ka namin ng pinakamahusay na presyo ayon sa iyong plano.
Mga pagtutukoy
| Supply Boltahe: | 4.5 V ~ 5.5 V |
|---|---|
| Supplier aparato Package: | 24-SOIC |
| serye: | 74BCT |
| packaging: | Tube |
| Package / Kaso: | 24-SOIC (0.295", 7.50mm Width) |
| Ibang pangalan: | SN74BCT8373ADWE4 SN74BCT8373ADWE4-ND SN74BCT8373ADWG4 SN74BCT8373ADWG4-ND |
| operating Temperature: | 0°C ~ 70°C |
| Bilang ng mga Bits: | 8 |
| Salalayan Type: | Surface Mount |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Tagagawa Standard Lead Time: | 6 Weeks |
| Manufacturer Bilang Bahagi: | SN74BCT8373ADW |
| logic Type: | Scan Test Device with D-Type Latches |
| Ang pinalawak Paglalarawan: | Scan Test Device with D-Type Latches IC 24-SOIC |
| paglalarawan: | IC SCAN TEST DEVICE LATCH 24SOIC |
| Email: | [email protected] |
Mga Kaugnay na bahagi para sa SN74BCT8373ADW
| larawan | Numero ng Bahagi | Mga Tagagawa | Paglalarawan | Tingnan |
|---|---|---|---|---|
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Pagtatanong |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
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