Bumili SN74BCT8374ADWR sa BYCHPS
Bumili na may garantiya
SN74BCT8374ADWR
- Numero ng Bahagi:
- SN74BCT8374ADWR
- Manufacturer:
- Paglalarawan:
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Lead Free Status / Katayuan ng RoHS:
- Lead libreng / RoHS compliant
- Magagamit na Dami:
- 19439 Pieces
- Data sheet:
- SN74BCT8374ADWR.pdf
pagpapakilala
BYCHIPS ay ang stocking distributor para sa SN74BCT8374ADWR, mayroon kaming mga stock para sa agarang pagpapadala at magagamit din para sa mahabang panahon supply. Mangyaring ipadala sa amin ang iyong plano sa pagbili para sa SN74BCT8374ADWR sa pamamagitan ng email, bibigyan ka namin ng pinakamahusay na presyo ayon sa iyong plano.
Mga pagtutukoy
| Supply Boltahe: | 4.5 V ~ 5.5 V |
|---|---|
| Supplier aparato Package: | 24-SOIC |
| serye: | 74BCT |
| packaging: | Tape & Reel (TR) |
| Package / Kaso: | 24-SOIC (0.295", 7.50mm Width) |
| operating Temperature: | 0°C ~ 70°C |
| Bilang ng mga Bits: | 8 |
| Salalayan Type: | Surface Mount |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Manufacturer Bilang Bahagi: | SN74BCT8374ADWR |
| logic Type: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Ang pinalawak Paglalarawan: | Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC |
| paglalarawan: | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Email: | [email protected] |
Mga Kaugnay na bahagi para sa SN74BCT8374ADWR
| larawan | Numero ng Bahagi | Mga Tagagawa | Paglalarawan | Tingnan |
|---|---|---|---|---|
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Pagtatanong |
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