Bumili SN74BCT8374ANTG4 sa BYCHPS
Bumili na may garantiya
SN74BCT8374ANTG4
- Numero ng Bahagi:
- SN74BCT8374ANTG4
- Manufacturer:
- Paglalarawan:
- IC SCAN TEST DEVICE W/FF 24-DIP
- Lead Free Status / Katayuan ng RoHS:
- Lead libreng / RoHS compliant
- Magagamit na Dami:
- 18871 Pieces
- Data sheet:
- SN74BCT8374ANTG4.pdf
pagpapakilala
BYCHIPS ay ang stocking distributor para sa SN74BCT8374ANTG4, mayroon kaming mga stock para sa agarang pagpapadala at magagamit din para sa mahabang panahon supply. Mangyaring ipadala sa amin ang iyong plano sa pagbili para sa SN74BCT8374ANTG4 sa pamamagitan ng email, bibigyan ka namin ng pinakamahusay na presyo ayon sa iyong plano.
Mga pagtutukoy
| Supply Boltahe: | 4.5 V ~ 5.5 V |
|---|---|
| Supplier aparato Package: | 24-PDIP |
| serye: | 74BCT |
| packaging: | Tube |
| Package / Kaso: | 24-DIP (0.300", 7.62mm) |
| Ibang pangalan: | SN74BCT8374ANTE4 SN74BCT8374ANTE4-ND |
| operating Temperature: | 0°C ~ 70°C |
| Bilang ng mga Bits: | 8 |
| Salalayan Type: | Through Hole |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Manufacturer Bilang Bahagi: | SN74BCT8374ANTG4 |
| logic Type: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Ang pinalawak Paglalarawan: | Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP |
| paglalarawan: | IC SCAN TEST DEVICE W/FF 24-DIP |
| Email: | [email protected] |
Mga Kaugnay na bahagi para sa SN74BCT8374ANTG4
| larawan | Numero ng Bahagi | Mga Tagagawa | Paglalarawan | Tingnan |
|---|---|---|---|---|
|
SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Pagtatanong |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
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