Bumili SN74BCT8374ADW sa BYCHPS
Bumili na may garantiya
SN74BCT8374ADW
- Numero ng Bahagi:
- SN74BCT8374ADW
- Manufacturer:
- Paglalarawan:
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Lead Free Status / Katayuan ng RoHS:
- Lead libreng / RoHS compliant
- Magagamit na Dami:
- 12626 Pieces
- Data sheet:
- SN74BCT8374ADW.pdf
pagpapakilala
BYCHIPS ay ang stocking distributor para sa SN74BCT8374ADW, mayroon kaming mga stock para sa agarang pagpapadala at magagamit din para sa mahabang panahon supply. Mangyaring ipadala sa amin ang iyong plano sa pagbili para sa SN74BCT8374ADW sa pamamagitan ng email, bibigyan ka namin ng pinakamahusay na presyo ayon sa iyong plano.
Mga pagtutukoy
| Supply Boltahe: | 4.5 V ~ 5.5 V |
|---|---|
| Supplier aparato Package: | 24-SOIC |
| serye: | 74BCT |
| packaging: | Tube |
| Package / Kaso: | 24-SOIC (0.295", 7.50mm Width) |
| Ibang pangalan: | 296-33849-5 SN74BCT8374ADW-ND SN74BCT8374ADWE4 SN74BCT8374ADWE4-ND SN74BCT8374ADWG4 SN74BCT8374ADWG4-ND |
| operating Temperature: | 0°C ~ 70°C |
| Bilang ng mga Bits: | 8 |
| Salalayan Type: | Surface Mount |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Tagagawa Standard Lead Time: | 6 Weeks |
| Manufacturer Bilang Bahagi: | SN74BCT8374ADW |
| logic Type: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Ang pinalawak Paglalarawan: | Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC |
| paglalarawan: | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Email: | [email protected] |
Mga Kaugnay na bahagi para sa SN74BCT8374ADW
| larawan | Numero ng Bahagi | Mga Tagagawa | Paglalarawan | Tingnan |
|---|---|---|---|---|
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Pagtatanong |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Pagtatanong |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Pagtatanong |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Pagtatanong |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Pagtatanong |
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